X-ray Analysis: XRF and XRT
The use of measuring equipment based on X ray radiation offers the contactless determination of layer thickness, density, weight per area or material composition. In most caseslow energy X ray sources can be used.
Normally the X ray radiation is limited to the measurement path itself so that outside of the equipment radiation can hardly be detected. If maintenance of the production device is required the measurement will be switched off; then no radiation will be present. Material properties are not changed or influenced by the radiation.
- measurement of layer thicknesses
- measurement of material thicknesses (steel tape, paper etc.)
- measurement of density in slurries
- image analysis (disbonding, cavities etc.)
